The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 21, 2012
Filed:
Aug. 19, 2008
Shohei Matsuoka, Tokyo, JP;
Shohei Matsuoka, Tokyo, JP;
Prsym, Inc., San Jose, CA (US);
Abstract
A multibeam scanning device, comprising: a plurality of first optical systems, each of the plurality of optical systems including a light source unit configured to emit a non-collimated light beam, and an optical element having a predetermined power and having an optical effect on the laser beam; a second optical system arranged on a downstream side of the plurality of first optical systems, including a first deflector on which light beams emitted by the plurality of first optical systems are incident, the first deflector being to deflect the laser beams, and a common optical system configured to change degree of divergence of each of the plurality of light beams; and an optical path shifting system configured to translate an incident optical path of the light beam which is emitted by the light source and incident on the optical element, wherein all the light beams incident on the first deflector are incident on the first deflector at substantially the same position, and wherein the optical elements are arranged such that optical axes of the optical elements intersect at a position spaced from the optical element by a distance equal to a focal length of the optical element.