The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 21, 2012
Filed:
Mar. 12, 2008
Tero O. Kokko, Tampere, FI;
Markku Mäntylä, Kangasala, FI;
Mikko V. Heikkilä, Pirkkala, FI;
Pekka Suopajärvi, Oulu, FI;
Marko Toskala, Orivesi, FI;
Antti Heikkinen, Helsinki, FI;
Tero O. Kokko, Tampere, FI;
Markku Mäntylä, Kangasala, FI;
Mikko V. Heikkilä, Pirkkala, FI;
Pekka Suopajärvi, Oulu, FI;
Marko Toskala, Orivesi, FI;
Antti Heikkinen, Helsinki, FI;
Metso Automation Oy, Helsinki, FI;
Abstract
One measuring part of a traversing measuring unit measures at least one characteristic of a web with a first radiation type from a plurality of measuring locations during a traversing movement at successive moments in time. At least two measuring parts of an array measuring unit measure at least one characteristic of the web with another radiation type during each traversing movement at a plurality of different moments in time by directing the measurement to a plurality of measuring locations in the web at each moment in time. A signal processing unit is arranged to estimate at least one characteristic measured by the traversing measuring unit with at least one measurement of the array measuring unit.