The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 21, 2012
Filed:
Sep. 19, 2011
Makoto Ochiai, Yokohama, JP;
Takahiro Miura, Yokohama, JP;
Hidehiko Kuroda, Yokohama, JP;
Fukashi Osakata, Fujisawa, JP;
Satoshi Yamamoto, Kawaguchi, JP;
Kentaro Tsuchihashi, Yokohama, JP;
Masahiro Yoshida, Chigasaki, JP;
Akira Tsuyuki, Yokohama, JP;
Makoto Ochiai, Yokohama, JP;
Takahiro Miura, Yokohama, JP;
Hidehiko Kuroda, Yokohama, JP;
Fukashi Osakata, Fujisawa, JP;
Satoshi Yamamoto, Kawaguchi, JP;
Kentaro Tsuchihashi, Yokohama, JP;
Masahiro Yoshida, Chigasaki, JP;
Akira Tsuyuki, Yokohama, JP;
Kabushiki Kaisha Toshiba, Tokyo, JP;
Abstract
A surface inspecting method including irradiating a laser light to a test object to generate an ultrasonic wave, irradiating a second laser light at a position apart by a known distance from a position where the laser light is irradiated and receiving a reflection light thereof, and correcting a generation surface wave of a received ultrasonic wave by using an ultrasonic wave other than the generation surface wave to thereby detect a flaw of the test object. A characterization of the generation surface wave is divided or integrated by the same characterization of the ultrasonic wave other than the generation surface wave included in an output signal to obtain a performance index value and obtain a depth of the flaw by applying the performance index value to a calibration curve in which a corresponding relation between the performance index value and the depth of the flaw is obtained preliminarily.