The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 21, 2012
Filed:
Apr. 15, 2011
Masud Azimi, Belmont, MA (US);
Arran Bibby, Savannah, GA (US);
Christopher D. Brown, Albuquerque, NM (US);
Peili Chen, Andover, MA (US);
Kevin J. Knopp, Newburyport, MA (US);
Daryoosh Vakhshoori, Cambridge, MA (US);
Peidong Wang, Carlisle, MA (US);
Masud Azimi, Belmont, MA (US);
Arran Bibby, Savannah, GA (US);
Christopher D. Brown, Albuquerque, NM (US);
Peili Chen, Andover, MA (US);
Kevin J. Knopp, Newburyport, MA (US);
Daryoosh Vakhshoori, Cambridge, MA (US);
Peidong Wang, Carlisle, MA (US);
Thermo Scientific Portable Analytical Instruments Inc., Tewksbury, MA (US);
Abstract
We disclose apparatus that includes: (a) an enclosure including an aperture; (b) a prism mounted in the enclosure so that a surface of the prism is exposed through the aperture; (c) an optical assembly contained within the enclosure, the optical assembly including a radiation source and a radiation detector, the source being configured to direct radiation towards the prism and the detector being configured to detect radiation from the source reflected from the exposed surface of the prism; and (d) an electronic processor contained within the enclosure, the electronic processor being in communication with the detector. The apparatus can be configured so that, during operation, the electronic processor determines information about a sample placed in contact with the exposed surface of the prism based on radiation reflected from the exposed prism surface while it is in contact with the sample.