The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 21, 2012

Filed:

Jun. 25, 2009
Applicants:

Tsukasa Murata, Yamato, JP;

Sadami Okada, Kawasaki, JP;

Inventors:

Tsukasa Murata, Yamato, JP;

Sadami Okada, Kawasaki, JP;

Assignee:

Nikon Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 3/14 (2006.01); H04N 5/262 (2006.01); G03B 13/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

In a preparation operation of a distortion correcting method, actual measured lens position information obtained by an optical system at a time of shooting an image, an error range in the lens position information, and a relational expression between a distortion pattern and the lens position information, are respectively obtained. In a correcting operation, actual measured data of the lens position information is fit to the relational expression to estimate the distortion pattern of the image shot by the optical system, and a temporary corrected image is obtained. In a selection operation, a distortion correcting pattern to be applied in main correcting performed on the image is selected based on the temporary corrected image. In a repeating operation, when the distortion correcting pattern is not selected, a value of the actual measured data is adjusted within the error range and the correcting operation is repeated.


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