The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 21, 2012
Filed:
Mar. 08, 2004
Applicant:
Wayne D. Young, Milpitas, CA (US);
Inventor:
Wayne D. Young, Milpitas, CA (US);
Assignee:
NVIDIA Corporation, Santa Clara, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G09G 5/02 (2006.01);
U.S. Cl.
CPC ...
Abstract
Error accumulation dithering is used to generate images of lower color resolution from input data of higher color resolution. A target color is received at high resolution for a current pixel of the image. The target color is intermediate between a first color and a second color at a low color resolution. One of the first color and the second color is selected as a final pixel color, based on whether an accumulated error determined from previous pixels is above or below a threshold amount. After selecting the final pixel color, an updated accumulated error is provided to the next pixel.