The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 21, 2012

Filed:

Feb. 19, 2008
Applicants:

Hiroaki Inoue, Tokyo, JP;

Masamichi Takagi, Tokyo, JP;

Inventors:

Hiroaki Inoue, Tokyo, JP;

Masamichi Takagi, Tokyo, JP;

Assignee:

NEC Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A semiconductor integrated circuit comprises a plurality of cores () connected with an inter-connection network () and a test controller () which is connected with the inter-connection network () and which issues a test control request associated with the test of the core () via the inter-connection network (). The inter-connection network () is constituted of a plurality of adapters () which serve as connection interfaces of the plurality of cores () and the test controller (), respectively, and a plurality of routers () which connect the plurality of adapters (). The adapters () connected with the core () comprise a core testing unit for vicariously testing core () connected to itself based on the test control request received from the test controller () via the inter-connection network ().


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