The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 21, 2012

Filed:

Aug. 11, 2008
Applicants:

Tal David, Beer-sheva, IL;

Yonathan Japha, Rehovot, IL;

Valery Dikovsky, Beer Sheva, IL;

Ron Folman, Rehovot, IL;

Inventors:

Tal David, Beer-sheva, IL;

Yonathan Japha, Rehovot, IL;

Valery Dikovsky, Beer Sheva, IL;

Ron Folman, Rehovot, IL;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H05H 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Ultra-cold (nano-Kelvin) neutral atoms can be trapped, manipulated, and measured, using integrated current carrying micro-structures on a nearby surface (Atom Chips). This can be utilized for the realization of ultra-sensitive sensors and quantum computation devices based on the quantum mechanical properties of the trapped atoms. However, harmful processes arise from the interactions between the atoms and the nearby surface. According to the present invention these harmful processes can be highly suppressed by using electrically anisotropic materials. It is shown that time-independent trapping potential corrugation leading to fragmentation of the trapped atom cloud can be suppressed, and that time dependent noise processes arising from the coupling of atoms to the nearby surface, and leading to loss of atoms from the trap, heating and loss of coherence can be significantly reduced.


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