The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 21, 2012

Filed:

Dec. 03, 2010
Applicants:

Kuo-chang Liao, Shanghai, CN;

Weijun Song, Shanghai, CN;

Dang Quan Liao, Shanghai, CN;

Inventors:

Kuo-Chang Liao, Shanghai, CN;

Weijun Song, Shanghai, CN;

Dang Quan Liao, Shanghai, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/331 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of forming a capacitor structure includes forming a pad oxide layer overlying a substrate, a nitride layer overlying the pad oxide layer, an interlayer dielectric layer overlying the nitride layer, and a patterned polysilicon mask layer overlying the interlayer dielectric layer. The method then applies a first RIE process to form a trench region through a portion of the interlayer dielectric layer using the patterned polysilicon mask layer and maintaining the first RIE to etch through a portion of the nitride layer and through a portion of the pad oxide layer. The method stops the first RIE when a portion of the substrate has been exposed. The method then forms an oxide layer overlying the exposed portion of the substrate and applies a second RIE process to continue to form the trench region by removing the oxide layer and removing a portion of the substrate to a predetermined depth.


Find Patent Forward Citations

Loading…