The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 21, 2012

Filed:

May. 20, 2011
Applicants:

Takatoshi Tanaka, Kawasaki, JP;

Hiroshi Asakawa, Ebina, JP;

Hitoshi Nagashima, Kawasaki, JP;

Masaya Asao, Yokohama, JP;

Inventors:

Takatoshi Tanaka, Kawasaki, JP;

Hiroshi Asakawa, Ebina, JP;

Hitoshi Nagashima, Kawasaki, JP;

Masaya Asao, Yokohama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B41M 5/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention provides a recording medium capable of inhibiting occurrence of undertrapping, lowering the visibility of scratches on the outermost surface of the recording medium and inhibiting occurrence of a mottled pattern when recording is conducted. The recording medium has a substrate and an ink receiving layer provided on the substrate, wherein the arithmetic average roughness Ra of the outermost surface of the recording medium as prescribed by JIS B 0601:2001 is 1.1 μm or more and 2.5 μm or less, and the skewness Rsk of a roughness curve of the outermost surface of the recording medium as prescribed by JIS B 0601:2001 is 0.1 or less.


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