The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 21, 2012
Filed:
Dec. 20, 2006
Applicant:
Thomas J. Mercolino, Stockton, NJ (US);
Inventor:
Thomas J. Mercolino, Stockton, NJ (US);
Assignee:
Authentiform Technologies, LLC, Chapel Hill, NC (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61L 33/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
The present invention relates to method for quality control of surface coated objects used independently or in conjunction with product authentication; methods for assuring proper product handling; methods for assuring that product contents' match product's label, comprising the use of microparticulate taggants having different detectable physical properties, wherein each combination of properties is used as an encoding bit to create codes.
Mercolino, Thomas. (2012). Methods for quality control (U.S. Patent No. 8247018). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8247018
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile