The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 14, 2012
Filed:
Dec. 05, 2006
Rakesh Agrawal, San Jose, CA (US);
Alvin K. Cheung, San Francisco, CA (US);
Karin Kailing, San Jose, CA (US);
Stefan Schoenauer, San Jose, CA (US);
Rakesh Agrawal, San Jose, CA (US);
Alvin K. Cheung, San Francisco, CA (US);
Karin Kailing, San Jose, CA (US);
Stefan Schoenauer, San Jose, CA (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
An implementation wherein RFID data is shared across independent organizations has been addressed. RFID data is usually spread across different parties, e.g. enterprises in a supply chain and thus, efficient query processing across all parties is required. Traceability is emerging as one of the key applications of RFID technology. A generic data model is introduced for querying RFID data across a network of independently operated data sources. The model can be used to facilitate traceability query processing and give a set of representative traceability queries. A newly designed process-and-forward approach is implemented for executing traceability queries.