The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 14, 2012
Filed:
Dec. 01, 2009
Rishab Aiyer Ghosh, Brussels, BE;
Vipul Ved Prakash, San Francisco, CA (US);
Rishab Aiyer Ghosh, Brussels, BE;
Vipul Ved Prakash, San Francisco, CA (US);
Topsy Labs, Inc., San Francisco, CA (US);
Abstract
Estimating influence includes receiving a subject graph, in which the subject graph includes two or more subject nodes, in which each subject node corresponds to a subject; and determining an objective influence measure for each first subject node of the subject graph, in which the determination is based at least on part on a function of inward scores and outward scores, in which inward scores are computed from one or more paths leading to the first subject of a length of at least one, and outward scores are computed from one or more paths leading from the first subject of a length of at least one.