The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 14, 2012
Filed:
Apr. 28, 2008
Sheng LU, Beijing, CN;
Qingbo Wang, Beijing, CN;
Meng YE, Beijing, CN;
Long Cheng, Beijing, CN;
Dong Jun Lan, Beijing, CN;
Xing Fang, Beijing, CN;
Gang Crl Wang, Beijing, CN;
Sheng Lu, Beijing, CN;
Qingbo Wang, Beijing, CN;
Meng Ye, Beijing, CN;
Long Cheng, Beijing, CN;
Dong Jun Lan, Beijing, CN;
Xing Fang, Beijing, CN;
Gang Crl Wang, Beijing, CN;
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method and system for correlating out interactions, which occur due to one or a set of specific events, of an application, which is deployed in multiple adjacent tiers in an actual environment is described. First, a simulation environment corresponding to the actual environment is created. Then, specific events are led to the actual environment and the simulation environment. A pattern(s) of interactions, which are related with the specific events, between adjacent tiers in the simulation environment and a large number of interactions between adjacent tiers in the actual environment are obtained. Afterwards, interactions, which are related with the specific events, between adjacent tiers among the obtained interactions between adjacent tiers in the actual environment are correlated using a template of the obtained pattern(s) of interactions, which are related with the specific events, between adjacent tiers in the simulation environment as a template.