The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 14, 2012
Filed:
Nov. 07, 2007
Günter Goldbach, Wörth/Wilfling, DE;
Ingo Wundrich, Munich, DE;
Günter Goldbach, Wörth/Wilfling, DE;
Ingo Wundrich, Munich, DE;
Brainlab AG, Feldkirchen, DE;
Abstract
A method for adjusting parameters of a calibration model in a position sensing system including a sensor for obtaining a measurement indicative of a location of an object, the method including: a) providing an initial set of model parameters for determining a relationship between a sensor measurement and a location value within a predetermined volume of location values; b) selecting a plurality of sub-segments of location values within the range of location values; c) providing for each of the selected plurality of sub-segments of location values a local set of model parameters for determining a relationship between a sensor measurement and a location value within the selected sub-segment of location values; d) obtaining a measurement from the sensor; e) determining an estimate of the location of the object from the sensor measurement and the initial set of model parameters; and f) identifying at least one of the selected sub-segments of location values related to the estimate of the location of the object.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile