The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 14, 2012
Filed:
Aug. 03, 2009
Wei-chen Lee, Taipei, TW;
Ming-chung Wu, Taipei, TW;
Wei-Chen Lee, Taipei, TW;
Ming-Chung Wu, Taipei, TW;
National Taiwan University of Science and Technology, Taipei, TW;
Abstract
A measuring system for tensile or compressive tests is provided. A set of mirrors includes a first plane mirror and a second plane mirror. The angles between the first plane mirror and the first axis and between the second plane mirror and the first axis are both a specific included angle, such that the first and second plane mirrors are symmetrical to the first axis. An object to be tested is disposed between the set of mirrors and an image capturing apparatus. Two extremities of the object have the first and second labels, respectively. The first and second mirror images of the first and second labels are generated through the first and second plane mirrors, respectively. After the object is tensed or compressed, the image capturing apparatus obtains the displacement of the first and second labels according to the shifting of the first and second mirror images.