The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 14, 2012
Filed:
Mar. 23, 2011
Oral Buyukozturk, Chestnut Hill, MA (US);
Tzu-yang Yu, Cambridge, MA (US);
Dennis Blejer, Sudbury, MA (US);
Oral Buyukozturk, Chestnut Hill, MA (US);
Tzu-Yang Yu, Cambridge, MA (US);
Dennis Blejer, Sudbury, MA (US);
Massachusetts Institute of Technology, Cambridge, MA (US);
Abstract
A non-contact, far-field radar nondestructive testing (NDT) method is disclosed that is capable of detecting at least one of defects, damages, and reinforcement conditions in near-surface region of multi-layer systems using monostatic inverse synthetic aperture radar (ISAR) measurements and applicable to various types of structural elements. The method includes the steps of conducting far-field monostatic ISAR measurements, executing an imaging algorithm, and executing a progressive image focusing algorithm.