The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 14, 2012
Filed:
Aug. 02, 2005
Yasuo Matsuyama, Tokyo, JP;
Ryo Kawamura, Tokyo, JP;
Keita Shimoda, Kawaguchi, JP;
Waseda University, Tokyo, JP;
Abstract
A feature pattern recognition system, method, and program capable of recognizing feature pattern with a high accuracy are provided. Discrete symbols (nucleotide symbols or the like) constituting a to-be-recognized sequence (a DNA sequence or the like) are converted to numerals by using symbol frequencies that are obtained according to sequence positions or types of the discrete symbols to generates test data or a test data matrix X, a matrix calculation (Y=WXor the like) of multiplying a separation matrix (Wor the like) obtained by an independent component analysis or a principal component analysis with the test data or the test data matrix Xis performed, separation data or a separation data matrix Yis obtained, and it is decided in which side of a threshold exists a feature decision element (elements of first row or the like) of the Y, so that it is decided whether or not the feature pattern (a promoter or the like) exists in the sequence by using a feature decision element (multiple rows of elements may be used).