The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 14, 2012

Filed:

Jun. 06, 2006
Applicants:

Santosh Kumar Sadananda, San Jose, CA (US);

Christopher M. Look, Pleasanton, CA (US);

Jeffery J. Maki, Fremont, CA (US);

Inventors:

Santosh Kumar Sadananda, San Jose, CA (US);

Christopher M. Look, Pleasanton, CA (US);

Jeffery J. Maki, Fremont, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 10/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and apparatus for implementing optical network quality using bit error rate and chromatic dispersion. According to one embodiment of the invention, a method includes the provision of quality of service in a wavelength division multiplexing optical network that supports a plurality of bit rates. As part of this method, the cumulative noise and cumulative chromatic dispersion for each available path as a whole is determined, where an available path is a series of two or more nodes each connected by an optical link on which a set of wavelengths is available for establishing a lightpath. In addition, different grades of path quality are distinguished based on bit error rate (BER), where BER is based on cumulative noise and bit rate. Furthermore, a minimum path quality is required based on chromatic dispersion decibel penalty, where chromatic dispersion decibel penalty is based on cumulative chromatic dispersion and bit rate.


Find Patent Forward Citations

Loading…