The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 14, 2012
Filed:
Dec. 01, 2008
Michael Chun Tao Chan, Macquarie Park, AU;
Eric Lap Min Cheung, Epping, AU;
Dmitri Katchalov, Neutral Bay, AU;
Kapil Batra, Westmead, AU;
Stephen Edward Ecob, Chatswood West, AU;
Michael Chun Tao Chan, Macquarie Park, AU;
Eric Lap Min Cheung, Epping, AU;
Dmitri Katchalov, Neutral Bay, AU;
Kapil Batra, Westmead, AU;
Stephen Edward Ecob, Chatswood West, AU;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
Disclosed herein is a method for identifying a constellation of alignment marks within an arrangement of computer readable marks in an image (), the arrangement of computer readable marks () including alignment marks (-) and data carrying marks (-). The alignment marks (-) define a reference grid within the arrangement of computer readable marks and the data carrying marks (-) are modulated with respect to the reference grid to encode data. The method selects at least two marks () from the arrangement of computer readable marks and determines a rotation center with reference to the selected marks (). The method then determines rotated positions for the selected marks by rotating each of the selected marks by a predetermined angle about the rotation center. For each rotated position, a mark having a position that is less than a predetermined threshold from the rotated position is located from the arrangement of marks and then the selected marks and the located marks are identified as the constellation of alignment marks.