The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 14, 2012

Filed:

Dec. 11, 2008
Applicants:

Zhigang Fan, Webster, NY (US);

Francis K. Tse, Rochester, NY (US);

Bingfeng Zhou, Beijing, CN;

Yadong Mu, Beijing, CN;

Tao He, Beijing, CN;

Inventors:

Zhigang Fan, Webster, NY (US);

Francis K. Tse, Rochester, NY (US);

Bingfeng Zhou, Beijing, CN;

Yadong Mu, Beijing, CN;

Tao He, Beijing, CN;

Assignee:

Xerox Corporation, Norwalk, CT (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/18 (2006.01);
U.S. Cl.
CPC ...
Abstract

Systems and methods are described that facilitate dominant point detection for text in a scanned document. The dominant points are classified as 'major' (e.g., structural) and 'minor' (e.g., serif). A set of rules or parameters for each character is determined off-line. During the text vectorization, OCR is performed and the rules (parameters) associated with the recognized character are selected. Both major and minor dominant points are detected as a maximization process with the parameter set. For minor dominant points, additional processes are optionally employed.


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