The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 14, 2012
Filed:
Oct. 19, 2007
Fredrick M. Davis, Orlando, FL (US);
Yakup Genc, Dayton, NJ (US);
Robert E. Shannon, Oviedo, FL (US);
Xiang Zhang, Cranbury, NJ (US);
Fredrick M. Davis, Orlando, FL (US);
Yakup Genc, Dayton, NJ (US);
Robert E. Shannon, Oviedo, FL (US);
Xiang Zhang, Cranbury, NJ (US);
Siemens Energy, Inc., Orlando, FL (US);
Abstract
A method of coalescing information about inspected objects. The method includes acquiring an image set of an object to be inspected, the image set having a three-dimensional model of the object and a plurality of two-dimensional images of the object. A location of interest is identified on a surface of the modeled object and global coordinate points of the three-dimensional model are designated that characterize the location of interest of the modeled object. A markup tag annotating the location of interest is associate with the designated global coordinate points of the three-dimensional model, and the markup tag is conveyed when viewing any one of the plurality of two-dimensional images of the image set that have at least one image point that correlates to a corresponding designated global coordinate point of the three-dimensional model that characterize the location of interest.