The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 14, 2012
Filed:
Mar. 30, 2010
Alexander Berkovich, Haifa, IL;
Hila Nachlieli, Haifa, IL;
Shai Emanueli, Rehovot, IL;
Haim Vladomirski, Rehovot, IL;
Michael Plotkin, Rehovot, IL;
Alexander Berkovich, Haifa, IL;
Hila Nachlieli, Haifa, IL;
Shai Emanueli, Rehovot, IL;
Haim Vladomirski, Rehovot, IL;
Michael Plotkin, Rehovot, IL;
Hewlett-Packard Development Company, L.P., Houston, TX (US);
Abstract
A method and apparatus are provided for evaluating the severity in a printed image of a repeating band print artifact. After electronically capturing the printed image, each of a plurality of patches taken from captured image is analysed to produce an artifact severity measure for the patch; an overall artifact severity value is then determined for the printed image from the patch severity measures. The analysis of each patch involves producing a spatial intensity profile across the patch substantially at right angles to an expected direction of extent of any repeating band print artifact present; a Fourier-related transform is then applied to the spatial intensity profile and the patch artifact severity measure generated by summing the resultant spatial frequency coefficients in a limited range about a frequency of interest.