The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 14, 2012

Filed:

Jun. 17, 2009
Applicants:

Subhodev Das, Princeton, NJ (US);

Yi Tan, Bordentown, NJ (US);

Ming-yee Chiu, Princeton Junction, NJ (US);

Andrew Coppock, Lawrenceville, NJ (US);

Feng Han, Melville, NJ (US);

Inventors:

Subhodev Das, Princeton, NJ (US);

Yi Tan, Bordentown, NJ (US);

Ming-Yee Chiu, Princeton Junction, NJ (US);

Andrew Coppock, Lawrenceville, NJ (US);

Feng Han, Melville, NJ (US);

Assignee:

SRI International, Menlo Park, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system and method for detecting a target in imagery is disclosed. At least one image region exhibiting changes in at least intensity is detected from among at least a pair of aligned images. A distribution of changes in at least intensity inside the at least one image region is determined using an unsupervised learning method. The distribution of changes in at least intensity is used to identify pixels experiencing changes of interest. At least one target from the identified pixels is identified using a supervised learning method. The distribution of changes in at least intensity is a joint hue and intensity histogram when the pair of images pertain to color imagery. The distribution of changes in at least intensity is an intensity histogram when the pair of images pertain to grey-level imagery.


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