The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 14, 2012

Filed:

May. 19, 2006
Applicants:

Yuan Xu, Eugene, OR (US);

Oleg Tischenko, München, DE;

Christoph Hoeschen, Hebertshausen, DE;

Inventors:

Yuan Xu, Eugene, OR (US);

Oleg Tischenko, München, DE;

Christoph Hoeschen, Hebertshausen, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01K 23/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An imaging method for imaging a region of investigation of an object, comprises the step of irradiating the region of investigation with at least one energy input beam along a plurality of projection directions, wherein the at least one energy input beam comprises a plurality of individual energy input beam components, wherein the energy input beam is shaped such that at least two of the energy input beam components have different cross-sections and groups of parallel energy input beam components being parallel to one of the projection directions provide a continuous irradiation of the region of investigation. Furthermore, a device for imaging the object is described.


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