The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 14, 2012
Filed:
Oct. 19, 2009
Applicants:
Pansop Kim, Torrance, CA (US);
Jeng-hong Chen, Temple City, CA (US);
Hsin-hsiang Liu, Torrance, CA (US);
Inventors:
Pansop Kim, Torrance, CA (US);
Jeng-Hong Chen, Temple City, CA (US);
Hsin-Hsiang Liu, Torrance, CA (US);
Assignee:
ISSC Technologies Corp., Hsinchu, TW;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/00 (2006.01); H04L 27/14 (2006.01);
U.S. Cl.
CPC ...
Abstract
The present invention discloses an effective apparatus and method to measure the received signal quality for a GFSK modulated signal with (or without) an unknown modulation index. The signal quality measurements are based on the decoded (unknown or known) bits and the trellis of the frequency discriminator output. This trellis is pre-calibrated with a reference Rx. The transmitted modulation index is also accurately estimated in this invention.