The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 14, 2012
Filed:
Apr. 13, 2010
Takeo Soejima, Hachioji, JP;
Yusei Ohkubo, Hachioji, JP;
Takeo Soejima, Hachioji, JP;
Yusei Ohkubo, Hachioji, JP;
JASCO Corporation, Hachioji-shi, Tokyo, JP;
Abstract
A highly accurate three-dimensional measurement base is specified with simple settings. When a peak occurs in the positive Z-axis direction, a hemisphere or semi-spheroid figure (z≧0) is placed to contain a position (x, y) where a base point should be obtained, scanning is performed such that the bottom of the figure contains the position (x, y), and the minimum value lof the difference between the Z position of a surface profile image and the height of the hemisphere or semi-spheroid figure at each position, and the height of the hemisphere or semi-spheroid figure at the position (x, y) are obtained. The maximum value of the sums is expressed as L, and a base point (X, Y, L) is specified. Base points are specified throughout the target surface by the same base point setting method, and a three-dimensional measurement base is specified on the basis of the specified base points.