The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 14, 2012

Filed:

Jan. 18, 2008
Applicants:

Frédéric Leblond, West Lebanon, NH (US);

Simon Fortier, Châteauguay, CA;

Inventors:

Frédéric Leblond, West Lebanon, NH (US);

Simon Fortier, Châteauguay, CA;

Assignee:

ART, Advanced Research Technologies Inc., Ville-Saint-Laurent, CA;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/24 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of optically imaging an object includes the determination of a source point and a destination point within the object. Planar boundaries are selected that approximate a geometrical shape of the object, and virtual sources are found using a reflection of the original source through the boundaries. Subsequent reflections of the added sources may be used to find higher order sources. Contributions to an optical transfer function from each of the added sources are added to determine a cumulative optical transfer function until a convergence limit is reached. The resulting optical transfer function is more accurate than the original in that it takes boundary phenomena into consideration.


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