The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 14, 2012
Filed:
May. 26, 2010
Kohei Watanabe, Yokohama, JP;
Tsuyoshi Nomoto, Tokyo, JP;
Takeshi Miyazaki, Yokohama, JP;
Toshio Tanaka, Tsu, JP;
Yasuhito Shimada, Nagoya, JP;
Kohei Watanabe, Yokohama, JP;
Tsuyoshi Nomoto, Tokyo, JP;
Takeshi Miyazaki, Yokohama, JP;
Toshio Tanaka, Tsu, JP;
Yasuhito Shimada, Nagoya, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
A sample observation system and a sample observation process are provided which do not need any special manipulation or treatment to limit the motion of the sample or adjust the orientation of the sample when observing the sample, and enable observation of samples simply from wider direction than ever. A sample observation system of a sample whose vertical direction is defined by gravity, wherein the system at least includes a sample holder having at least one penetrating hole for retaining a liquid containing the sample; an observation unit for observing the sample; and an angle adjusting unit for varying the angle of the observation unit to the direction of the gravity which acts on the sample in a condition in which the sample holder and the observation unit have a fixed relative angle therebetween.