The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 14, 2012

Filed:

May. 01, 2009
Applicants:

Maurizio A. Splendore, Walnut Creek, CA (US);

Eloy R. Wouters, San Jose, CA (US);

Paul R. Atherton, San Jose, CA (US);

Jean Jacques Dunyach, San Jose, CA (US);

Inventors:

Maurizio A. Splendore, Walnut Creek, CA (US);

Eloy R. Wouters, San Jose, CA (US);

Paul R. Atherton, San Jose, CA (US);

Jean Jacques Dunyach, San Jose, CA (US);

Assignee:

Thermo Finnigan LLC, San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for analyzing a sample comprising the steps of: generating ions from the sample within an ionization chamber at substantially atmospheric pressure; entraining the ions in a background gas; transferring the background gas and entrained ions to an evacuated chamber of a mass spectrometer system using a single-piece capillary having an inlet end and an outlet end, wherein a portion of the capillary adjacent to the outlet end comprises an inner diameter that is greater than an inner diameter of an adjoining portion of the capillary; and analyzing the ions using a mass analyzer of the mass spectrometer system.


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