The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 14, 2012
Filed:
Mar. 07, 2007
Applicants:
Andreas Bausewein, Langenbach, DE;
Thomas Bierhoff, Volkmarsen, DE;
Dirk David Goldbeck, München, DE;
Tobias Happel, Berlin, DE;
Hans-jürgen Schrage, Lippstadt, DE;
Inventors:
Andreas Bausewein, Langenbach, DE;
Thomas Bierhoff, Volkmarsen, DE;
Dirk David Goldbeck, München, DE;
Tobias Happel, Berlin, DE;
Hans-Jürgen Schrage, Lippstadt, DE;
Assignee:
Siemens Aktiengesellschaft, Munich, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 5/103 (2006.01);
U.S. Cl.
CPC ...
Abstract
The profile of the spinal column and changes in the profile of the spinal column are continuously measured during movement along the entire spinal column in all degrees of freedom of its deformation.
Bausewein, Andreas. (2012). Device, sensor, sensor element and method for measuring the profile of a spinal column and for measuring changes in the profile of the spinal column (U.S. Patent No. 8241231). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8241231
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile