The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 14, 2012

Filed:

Nov. 09, 2009
Applicants:

Young Gon Kim, Daejeon, KR;

Jong Heung Park, Daejeon, KR;

Inventors:

Young Gon Kim, Daejeon, KR;

Jong Heung Park, Daejeon, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 7/10 (2006.01); G06F 7/00 (2006.01); G06Q 30/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Provided is a method and system for measuring traffic quality in distribution using test mail into which a radio frequency identity tag is inserted. The system accepts at least one test distribution piece including a tag, and collects information of test distribution by sensing a tag included with the test distribution piece at measuring points for measuring a time from acceptance to delivery of a general distribution piece. The system generates a processing rate and a delivery rate of distribution based on information of the test distribution pieces collected from the measuring points.


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