The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 14, 2012
Filed:
Aug. 25, 2009
Applicant:
Moku Naruishi, Kanagawa, JP;
Inventor:
Moku Naruishi, Kanagawa, JP;
Assignee:
Ricoh Company, Limited, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01L 5/00 (2006.01); G01N 3/30 (2006.01);
U.S. Cl.
CPC ...
Abstract
An impact detecting apparatus that is configured to be attached to an object and includes a drop-impact display unit configured to display a direction of drop impact when the object is dropped; and a tilt display unit configured to display a direction of tilting when the object is tilted. The drop-impact display unit and the tilt display unit displays the direction of drop impact and the direction of tilting at the same time.
Naruishi, Moku. (2012). Impact detecting apparatus and package device (U.S. Patent No. 8240270). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8240270
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