The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 14, 2012
Filed:
Feb. 18, 2009
Yanyan Wu, Schenectady, NY (US);
Dean Michael Robinson, Schenectady, NY (US);
Shridhar Nath, Niskayuna, NY (US);
Nicholas Joseph Kray, Blue Ash, OH (US);
Yanyan Wu, Schenectady, NY (US);
Dean Michael Robinson, Schenectady, NY (US);
Shridhar Nath, Niskayuna, NY (US);
Nicholas Joseph Kray, Blue Ash, OH (US);
General Electric Company, Niskayuna, NY (US);
Abstract
A method for integrating a measurement device for use in measuring a machine component includes providing a coordinate measuring device, such as a coordinate measuring machine (CMM), and integrating with a plurality of nondestructive examination (NDE) capabilities with a plurality of coordinate measuring device capabilities to form an inspection probe. The method further includes integrating the NDE inspection probe with the coordinate measuring device such that the inspection probe substantially simultaneously measures a plurality of NDE measurements and external/internal geometry and defects of machine component, which are linked to actual component dimensional information provided by CMM. The inspection data can be simultaneously linked to and/or displayed together with a CAD model to enable a direct comparison between the inspection data and the nominal requirements carried on the CAD model.