The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 14, 2012
Filed:
Aug. 27, 2009
Isaias S. Chocron, San Antonio, TX (US);
Arthur E. Nicholls, Helotes, TX (US);
Charles E. Anderson, Jr., San Antonio, TX (US);
James D. Walker, San Antonio, TX (US);
Isaias S. Chocron, San Antonio, TX (US);
Arthur E. Nicholls, Helotes, TX (US);
Charles E. Anderson, Jr., San Antonio, TX (US);
James D. Walker, San Antonio, TX (US);
Southwest Research Institute, San Antonio, TX (US);
Abstract
The present disclosure relates to a system and method for characterizing an impact in a fabric. The system may include a sensing element woven in the fabric wherein a parameter of the sensing element depends on a strain in the sensing element; a transducer coupled to the sensing element wherein the transducer is configured to generate an output based on the parameter of the sensing element; and a controller coupled to the transducer, the controller configured to receive the output of the transducer, to determine a strain in the sensing element based, at least in part, on a change in the output of the transducer, and to characterize the impact in the fabric based on the strain in the sensing element.