The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 14, 2012
Filed:
Mar. 30, 2009
Satoshi Annaka, Tokyo, JP;
Shuichi Sato, Tokyo, JP;
Satoshi Annaka, Tokyo, JP;
Shuichi Sato, Tokyo, JP;
Hoya Corporation, Tokyo, JP;
Abstract
A bevel perimeter measurement apparatus () includes a retractable slider (), a stylus holder () disposed to be vertically movable on the slider (), a stylus () which has a bevel measurement groove () formed on its outer periphery and is provided on the stylus holder (), a pressing force application device () which moves the slider () forward at the time of bevel measurement to press the stylus () against the edge surface () of a spectacle lens (), and a retracting device () which holds the stylus holder () at the retraction position during non-measurement. When the stylus holder () is released from the retracting device () at the time of measurement, it ascends using the spring force of biasing springs () to engage the bevel measurement groove () in the stylus () with a bevel () of the spectacle lens ().