The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 07, 2012
Filed:
Dec. 04, 2009
Applicant:
Vijay Kumar Reddy, Plano, TX (US);
Inventor:
Vijay Kumar Reddy, Plano, TX (US);
Assignee:
Texas Instruments Incorporated, Dallas, TX (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/22 (2006.01);
U.S. Cl.
CPC ...
Abstract
A set of parameter drifts is recorded over a period of time for each of a series of stress tests on a system at various stress levels. Each set of the recorded parameter drifts is plotted as parameter drift versus time. The plots are then time shifted in relation to a reference plot to form a single parameter drift plot. A non-linear equation is fitted to the single parameter drift plot and then used to predict parameter drift over the life of the system. The non-linear equation may be modified by adding a stress acceleration factor to allow prediction of parameter drift over time at different stress levels.