The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 07, 2012

Filed:

Jul. 10, 2008
Applicants:

Kyoung Lae Cho, Yongin-si, KR;

Jae Hong Kim, Seoul, KR;

Yoon Dong Park, Yongin-si, KR;

Jun Jin Kong, Yongin-si, KR;

Dong Hyuk Chae, Seoul, KR;

Inventors:

Kyoung Lae Cho, Yongin-si, KR;

Jae Hong Kim, Seoul, KR;

Yoon Dong Park, Yongin-si, KR;

Jun Jin Kong, Yongin-si, KR;

Dong Hyuk Chae, Seoul, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Example embodiments may provide a memory device and memory data reading method. The memory device according to example embodiments may include a multi-bit cell array, an error detector which may read a first data page from a memory page in the multi-bit cell array and may detect an error-bit of the first data page, and an estimator which may identify a multi-bit cell where the error-bit is stored and may estimate data stored in the identified multi-bit cell among data of a second data page. Therefore, the memory device and memory data reading method may have an effect of reducing an error when reading data stored in the multi-bit cell and monitoring a state of the multi-bit cell without additional overhead.


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