The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 07, 2012
Filed:
Aug. 04, 2009
Charles E. Crain, Ii, Austin, TX (US);
Adam H. Dewhirst, Austin, TX (US);
Robert L. Ortman, Atlanta, GA (US);
Charles E. Crain, II, Austin, TX (US);
Adam H. Dewhirst, Austin, TX (US);
Robert L. Ortman, Atlanta, GA (US);
National Instruments Corporation, Austin, TX (US);
Abstract
Various embodiments of a system and method for performing a measurement application are described herein. The system may include a host computer having a processor, and a measurement device having a programmable hardware element. The programmable hardware element may be configured to perform a loop to acquire measurement data from a physical system. The host computer may be configured to perform another loop to read the measurement data from the programmable hardware element and use the measurement data in a measurement and control algorithm. The host computer may be further configured to perform a synchronization algorithm to keep the measurement data acquisition loop performed by the programmable hardware element synchronized with the measurement and control loop performed by the host computer.