The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 07, 2012

Filed:

Dec. 22, 2008
Applicant:

Takefumi Oguma, Tokyo, JP;

Inventor:

Takefumi Oguma, Tokyo, JP;

Assignee:

NEC Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04B 10/08 (2006.01); H04B 10/00 (2006.01); G01R 35/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of collecting data from an optical channel monitor for monitoring the power of a wavelength-division multiplexed light signal at each wavelength is disclosed. The total light power is analog-to-digital converted by an A/D converter. The data of the total light power which has been analog-to-digital converted is compared with a reference light power by a comparator for each conversion, and when the difference between the total light power and the reference light power exceeds a predetermined threshold, a power fluctuation flag is turned ON. After the comparison, the above process of the analog-to-digital conversion and the comparison is iterated until the optical channel monitor completes the data collection for each wavelength. Thereafter, the processor determines whether the power fluctuation flag is ON or not. When the power fluctuation flag is ON, the processor discards the currently collected data and maintains the data which were collected immediately before.


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