The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 07, 2012
Filed:
Jul. 20, 2007
Stephan Tosch, Sprockhövel, DE;
Reinhard Gross, Leverkusen, DE;
Marcus Brand, Dormagen, DE;
Hans Tups, Bergisch Gladbach, DE;
Stephan Tosch, Sprockhövel, DE;
Reinhard Gross, Leverkusen, DE;
Marcus Brand, Dormagen, DE;
Hans Tups, Bergisch Gladbach, DE;
Bayer Technology Services GmbH, Leverkusen, DE;
Abstract
The invention relates to an optical measurement probe for process monitoring, having a distal end, arranged in the region of a process apparatus, with a light entrance opening, and a proximal end coupled to a spectrometer, wherein a shaft comprising a light-guiding connection between the distal and proximal ends of the measurement probe is arranged between the two ends. The measurement probe is characterized in that the measurement probe has, in its distal region relative to the shaft and/or the proximal end, a reduced external diameter (FIG.).