The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 07, 2012
Filed:
Sep. 08, 2008
Jian Sun, Shenzhen, CN;
Hua-dong Cheng, Shenzhen, CN;
Wen-chuan Lian, Taipei Hsien, TW;
Han-che Wang, Taipei Hsien, TW;
Xiao-guang LI, Shenzhen, CN;
Kuan-hong Hsieh, Taipei Hsien, TW;
Jian Sun, Shenzhen, CN;
Hua-Dong Cheng, Shenzhen, CN;
Wen-Chuan Lian, Taipei Hsien, TW;
Han-Che Wang, Taipei Hsien, TW;
Xiao-Guang Li, Shenzhen, CN;
Kuan-Hong Hsieh, Taipei Hsien, TW;
Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd., Shenzhen, Guangdong Province, CN;
Hon Hai Precision Industry Co., Ltd., Tu-Cheng, New Taipei, TW;
Abstract
A display testing method applied on an apparatus is provided, the apparatus being connected with an image capturing device. The method includes: controlling the image capturing device to capture and store images of displays to be tested; determining a first vertex of a test area on the captured image, determining a test area according to the determined first vertex; and testing parameters of the display according to the test area.