The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 07, 2012
Filed:
Mar. 21, 2008
Ali Can, Troy, NY (US);
Robert August Kaucic, Niskayuna, NY (US);
Paulo Ricardo Mendonca, Clifton Park, NY (US);
Zhaohui Sun, Niskayuna, NY (US);
Joseph Manuel Portaz, Hamilton, OH (US);
Ali Can, Troy, NY (US);
Robert August Kaucic, Niskayuna, NY (US);
Paulo Ricardo Mendonca, Clifton Park, NY (US);
Zhaohui Sun, Niskayuna, NY (US);
Joseph Manuel Portaz, Hamilton, OH (US);
General Electric Company, Niskayuna, NY (US);
Abstract
A method for identifying defects in radiographic image data corresponding to a scanned object is provided. The method includes acquiring radiographic image data corresponding to a scanned object. In one embodiment, the radiographic image data includes an inspection test image and a reference image corresponding to the scanned object. The method includes identifying one or more regions of interest in the reference image and aligning the inspection test image with the regions of interest identified in the reference image, to obtain a residual image. The method further includes identifying one or more defects in the inspection test image based upon the residual image and one or more defect probability values computed for one or more pixels in the residual image.