The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 07, 2012
Filed:
Sep. 11, 2009
Stephan Craig Moen, Wilmington, NC (US);
Craig Glenn Meyers, Salem, VA (US);
John Alexander Petzen, Roanoke, VA (US);
Adam Muhling Foard, Christianburg, VA (US);
Stephan Craig Moen, Wilmington, NC (US);
Craig Glenn Meyers, Salem, VA (US);
John Alexander Petzen, Roanoke, VA (US);
Adam Muhling Foard, Christianburg, VA (US);
GE-Hitachi Nuclear Energy Americas LLC, Wilmington, NC (US);
Abstract
A method of calibrating a nuclear instrument using a gamma thermometer may include: measuring, in the instrument, local neutron flux; generating, from the instrument, a first signal proportional to the neutron flux; measuring, in the gamma thermometer, local gamma flux; generating, from the gamma thermometer, a second signal proportional to the gamma flux; compensating the second signal; and calibrating a gain of the instrument based on the compensated second signal. Compensating the second signal may include: calculating selected yield fractions for specific groups of delayed gamma sources; calculating time constants for the specific groups; calculating a third signal that corresponds to delayed local gamma flux based on the selected yield fractions and time constants; and calculating the compensated second signal by subtracting the third signal from the second signal. The specific groups may have decay time constants greater than 5×10seconds and less than 5×10seconds.