The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 07, 2012
Filed:
Jan. 08, 2010
Prakash Sethia, Bangalore, IN;
Ramesh Krishnan, Bangalore, IN;
Nikhil Deshmukh, Bangalore, IN;
National Instruments Corporation, Austin, TX (US);
Abstract
System and method for evaluating a transmitter by estimating IQ impairments in an orthogonal frequency division multiplexed (OFDM) signal generated by the transmitter. The OFDM signal may be received. The OFDM signal may represent a stream of symbols, each comprising a plurality of subcarriers. At least a subset of the subcarriers may be pilot subcarriers. The pilot subcarriers may be grouped into one or more groups of pilot subcarriers based on one or more conditions: a pilot subcarrier which satisfies a condition in its relation to a mirror subcarrier may be grouped with other pilot subcarriers which also satisfy the condition in relation to mirror subcarriers. An estimate of one or more of gain imbalance or quadrature skew of the OFDM signal may be calculated based on the one or more groups of pilot subcarriers and the one or more conditions. The estimate may be used to evaluate the transmitter.