The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 07, 2012

Filed:

Jan. 05, 2009
Applicants:

Suh-ho Lee, Seongnam-si, KR;

Soo-kyun Kim, Seoul, KR;

Joo-kwang Kim, Yongin-si, KR;

Tae-kyun Kim, Seongnam-si, KR;

Inventors:

Suh-Ho Lee, Seongnam-si, KR;

Soo-Kyun Kim, Seoul, KR;

Joo-Kwang Kim, Yongin-si, KR;

Tae-Kyun Kim, Seongnam-si, KR;

Assignee:

Samsung Electronics Co., Ltd., Samsung-ro, Yeongtong-gu, Suwon-si, Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 17/00 (2006.01); G06T 15/00 (2006.01); G09G 5/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus and method for simplifying 3-Dimensional (3D) mesh data are disclosed. The method includes measuring discrete curvature at each point of received 3D mesh data, calculating an error based on distance-curvature error metrics including the discrete curvature, first sorting a low curvature one of the calculated error values in a heap in ascending order, selecting a minimum error among the calculated errors, determining if the minimum error is less than a threshold, contracting an edge if the selected minimum error is greater than the threshold, and recalculating an error of a surface neighboring to a surface on which the contracted edge belongs and re-sorting the calculated error values.


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