The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 07, 2012
Filed:
Dec. 19, 2008
Remi Duheille, Rueil-Malmaison, FR;
Olivier Schevin, Paris, FR;
Ros Kiri Ing, Paris, FR;
Elo Touch Solutions, Inc., Menlo Park, CA (US);
Abstract
A method for determining the locations of at least two impacts Fand Fon a surface using one or more sensors S, i=1 to n, with n being the number of sensors, and the impacts Fand Fgenerating a signal being sensed by the one or more sensors, wherein each sensor provides a sensed signal s(t), i=1 to n, with n being the number of sensors. To be able to determine simultaneous impacts of different amplitudes the method includes identifying the location x of one impact, and determining a modified sensed signal s'(t) for each sensor in which the contribution due to the identified impact is reduced and which is based on a comparison, in particular a correlation, of each of the sensed signals s(t) and a predetermined reference signal r(t) corresponding to a reference impact Rat location j. The method can also be based on couples of sensed signals.