The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 07, 2012

Filed:

Feb. 09, 2011
Applicants:

Takatoshi Tanaka, Kawasaki, JP;

Hiroshi Asakawa, Ebina, JP;

Hitoshi Nagashima, Kawasaki, JP;

Inventors:

Takatoshi Tanaka, Kawasaki, JP;

Hiroshi Asakawa, Ebina, JP;

Hitoshi Nagashima, Kawasaki, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B41M 5/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A recording medium comprising a substrate and at least two porous ink receiving layers provided thereon of which a lower layer, second distant from the substrate, is arranged on the substrate side of an upper layer, most distant from the substrate. Pore distribution curves of the upper and lower layers respectively have one peak and two peaks. When pore radii giving the one peak and the two peaks are respectively regarded as R1 and R2, R3 where R2 is smaller than R3, R1 is 8 to 11 nm, R2 is 5 nm or more, R2 is smaller than R1, a difference between R1 and R2 is 2 nm or more, R3 is not less than R1, a difference between R3 and R1 is 3 nm or less. When pore volumes at the pore radii of R2 and R3 are respectively Vand V, a proportion V/Vis 0.8 to 2.4.


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