The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 07, 2012
Filed:
Aug. 29, 2005
Unmin Bae, Seattle, WA (US);
Yongmin Kim, Lake Forest Park, WA (US);
Unmin Bae, Seattle, WA (US);
Yongmin Kim, Lake Forest Park, WA (US);
University of Washington through its Center for Commercialization, Seattle, WA (US);
Abstract
Strain is directly estimated in ultrasound elasticity imaging without computing displacement or resorting to spectral analysis. Conventional ultrasound elasticity imaging relies on calculating displacement and strain is computed from a derivative of the displacement. However, for typical parameter values used in ultrasound elasticity imaging, the displacement can be as large as a hundred times or displacement differences. If a tiny error in the calculation of displacement occurs, this could drastically affect the calculation of strain. By directly estimating strain, image quality is enhanced and the reduction in computational effort facilitates commercialization to aid in diagnosing disease or cancerous conditions.