The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 07, 2012

Filed:

Nov. 12, 2009
Applicants:

Joshua M. Hudman, Sammamish, WA (US);

Maarten Niesten, Kirkland, WA (US);

Richard A. James, Woodinville, WA (US);

Inventors:

Joshua M. Hudman, Sammamish, WA (US);

Maarten Niesten, Kirkland, WA (US);

Richard A. James, Woodinville, WA (US);

Assignee:

Microvision, Inc., Redmond, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03B 21/14 (2006.01); G02B 26/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

Briefly, in accordance with one or more embodiments, a scanned beam display may utilize one or more post-scan optics while at least partially maintaining an infinite focus, or nearly infinite focus, property of the display. The display may comprise a light source to generate a light beam, a scanning platform to generate a raster scan from the light beam projected as a projected image, one or more post-scan optics to at least partially adjust the projected image, and one or more collimating optics to focus the light beam from the light source, the one or more collimating optics having a selected focal length to at least partially provide infinite, or nearly infinite focus, of the projected image at or beyond a selected distance.


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